Abou-Ras, D., Kavalakkatt, J., Nichterwitz, M., Schäfer, N., Harndt, S., Wilkinson, A., . . . Bauer, F. (2013). Electron backscatter diffraction: An important tool for analyses of structure-property relationships in thin-film solar cells.
Chicago Style (17th ed.) CitationAbou-Ras, D., J. Kavalakkatt, M. Nichterwitz, N. Schäfer, S. Harndt, A. Wilkinson, K. Tsyrulin, H. Schulz, and F. Bauer. Electron Backscatter Diffraction: An Important Tool for Analyses of Structure-property Relationships in Thin-film Solar Cells. 2013.
MLA引文Abou-Ras, D., et al. Electron Backscatter Diffraction: An Important Tool for Analyses of Structure-property Relationships in Thin-film Solar Cells. 2013.
警告:這些引文格式不一定是100%准確.