Electron backscatter diffraction: An important tool for analyses of structure-property relationships in thin-film solar cells
The present work gives an overview of the application of electron backscatter diffraction (EBSD) in the field of thin-film solar cells, which consist of stacks of polycrystalline layers on various rigid or flexible substrates. EBSD provides access to grain-size and local-orientation distributions, f...
Asıl Yazarlar: | , , , , , , , , |
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Materyal Türü: | Journal article |
Dil: | English |
Baskı/Yayın Bilgisi: |
2013
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