Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films
We have studied the effect of the Cu capping thickness (in the range 20 ≤ tcu ≤ 180 Å) on the magnetic and structural properties of ultrathin FCC 40Å Ni/Cu(001) films by means of magneto-optic Kerr effect (MOKE) magnetometry, polarised neutron reflection (PNR) and grazing incidence X-ray surface dif...
| Main Authors: | , , , , , , , |
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| 格式: | Conference item |
| 出版: |
2001
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