Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping
Annular dark-field scanning transmission electron microscopy is a powerful tool to study crystal defects at the atomic scale but historically single slow-scanned frames have been plagued by low-frequency scanning-distortions prohibiting accurate strain mapping at atomic resolution. Recently, multi-f...
| Main Authors: | , , , , , , |
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| 格式: | Journal article |
| 出版: |
Elsevier
2017
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