Two-dimensional wavefront characterization of adaptable corrective optics and Kirkpatrick-Baez mirror system using ptychography
Aberrations introduced during fabrication degrade the performance of X-ray optics and their ability to achieve diffraction limited focusing. Corrective optics can counteract these errors by introducing wavefront perturbations prior to the optic which cancel out the distortions. Here we demonstrate t...
Main Authors: | Moxham, TEJ, Dhamgaye, V, Laundy, D, Fox, OJL, Khosroabadi, H, Sawhney, K, Korsunsky, AM |
---|---|
Format: | Journal article |
Language: | English |
Published: |
Optica Publishing Group
2022
|
Similar Items
-
Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source
by: Moxham, TEJ, et al.
Published: (2021) -
Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
by: Moxham, TEJ, et al.
Published: (2020) -
Wavefront analysis and phase correctors design using SHADOW
by: Hossein Khosroabadi, et al.
Published: (2024-05-01) -
Kirkpatrick-Baez mirrors commissioning for coherent scattering and imaging endstation at SXFEL
by: Yajun Tong, et al.
Published: (2022-08-01) -
Design and testing of a Kirkpatrick-Baez optics variation
by: Stieglitz Veronika, et al.
Published: (2022-01-01)