Two-dimensional wavefront characterization of adaptable corrective optics and Kirkpatrick-Baez mirror system using ptychography
Aberrations introduced during fabrication degrade the performance of X-ray optics and their ability to achieve diffraction limited focusing. Corrective optics can counteract these errors by introducing wavefront perturbations prior to the optic which cancel out the distortions. Here we demonstrate t...
المؤلفون الرئيسيون: | Moxham, TEJ, Dhamgaye, V, Laundy, D, Fox, OJL, Khosroabadi, H, Sawhney, K, Korsunsky, AM |
---|---|
التنسيق: | Journal article |
اللغة: | English |
منشور في: |
Optica Publishing Group
2022
|
مواد مشابهة
-
Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source
حسب: Moxham, TEJ, وآخرون
منشور في: (2021) -
Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
حسب: Moxham, TEJ, وآخرون
منشور في: (2020) -
Wavefront analysis and phase correctors design using SHADOW
حسب: Hossein Khosroabadi, وآخرون
منشور في: (2024-05-01) -
Kirkpatrick-Baez mirrors commissioning for coherent scattering and imaging endstation at SXFEL
حسب: Yajun Tong, وآخرون
منشور في: (2022-08-01) -
Design and testing of a Kirkpatrick-Baez optics variation
حسب: Stieglitz Veronika, وآخرون
منشور في: (2022-01-01)