Two-dimensional wavefront characterization of adaptable corrective optics and Kirkpatrick-Baez mirror system using ptychography
Aberrations introduced during fabrication degrade the performance of X-ray optics and their ability to achieve diffraction limited focusing. Corrective optics can counteract these errors by introducing wavefront perturbations prior to the optic which cancel out the distortions. Here we demonstrate t...
Autors principals: | Moxham, TEJ, Dhamgaye, V, Laundy, D, Fox, OJL, Khosroabadi, H, Sawhney, K, Korsunsky, AM |
---|---|
Format: | Journal article |
Idioma: | English |
Publicat: |
Optica Publishing Group
2022
|
Ítems similars
-
Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source
per: Moxham, TEJ, et al.
Publicat: (2021) -
Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
per: Moxham, TEJ, et al.
Publicat: (2020) -
Wavefront analysis and phase correctors design using SHADOW
per: Hossein Khosroabadi, et al.
Publicat: (2024-05-01) -
Kirkpatrick-Baez mirrors commissioning for coherent scattering and imaging endstation at SXFEL
per: Yajun Tong, et al.
Publicat: (2022-08-01) -
Design and testing of a Kirkpatrick-Baez optics variation
per: Stieglitz Veronika, et al.
Publicat: (2022-01-01)