Two-dimensional wavefront characterization of adaptable corrective optics and Kirkpatrick-Baez mirror system using ptychography
Aberrations introduced during fabrication degrade the performance of X-ray optics and their ability to achieve diffraction limited focusing. Corrective optics can counteract these errors by introducing wavefront perturbations prior to the optic which cancel out the distortions. Here we demonstrate t...
Autori principali: | Moxham, TEJ, Dhamgaye, V, Laundy, D, Fox, OJL, Khosroabadi, H, Sawhney, K, Korsunsky, AM |
---|---|
Natura: | Journal article |
Lingua: | English |
Pubblicazione: |
Optica Publishing Group
2022
|
Documenti analoghi
Documenti analoghi
-
Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source
di: Moxham, TEJ, et al.
Pubblicazione: (2021) -
Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
di: Moxham, TEJ, et al.
Pubblicazione: (2020) -
Wavefront analysis and phase correctors design using SHADOW
di: Hossein Khosroabadi, et al.
Pubblicazione: (2024-05-01) -
Kirkpatrick-Baez mirrors commissioning for coherent scattering and imaging endstation at SXFEL
di: Yajun Tong, et al.
Pubblicazione: (2022-08-01) -
Design and testing of a Kirkpatrick-Baez optics variation
di: Stieglitz Veronika, et al.
Pubblicazione: (2022-01-01)