Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime
Excess-carrier recombination lifetime is a key parameter in silicon solar cell design and production. With the vast international use and recent standardization (SEMI PV13) of eddy-current wafer and brick silicon lifetime test instruments, it is important to quantify the inter-and intralaboratory re...
| Main Authors: | , , , , , , , , , , , , , , |
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| 格式: | Journal article |
| 语言: | English |
| 出版: |
2014
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