EINZEL LENSES IN ATOM PROBE DESIGNS

EINZEL LENSES IN ATOM PROBE DESIGNS

Bibliografiske detaljer
Main Authors:	Cerezo, A, Miller, M
Format:	Conference item
Udgivet:	1991

Lignende værker

A Hyperbolic Potential Field Model for Designing an Einzel Lens of Low Aberrations
af: Sabah M. Juma
Udgivet: (2002-12-01)

Einzel lens chopper and behavior of the chopped beam in the KEK digital accelerator
af: K. W. Leo, et al.
Udgivet: (2013-04-01)

IMPROVEMENTS IN 3-DIMENSIONAL ATOM-PROBE DESIGN
af: Cerezo, A, et al.
Udgivet: (1994)

Design of a scanning atom probe with improved mass resolution
af: Cerezo, A, et al.
Udgivet: (2000)

PULSED LASER ATOM PROBE CHARACTERIZATION OF SILICON-CARBIDE
af: Miller, M, et al.
Udgivet: (1989)

NEW DIMENSIONS IN ATOM-PROBE ANALYSIS
af: Cerezo, A, et al.
Udgivet: (1992)

VISUALIZATION AND ANALYSIS OF 3-DIMENSIONAL ATOM PROBE DATA
af: Cerezo, A, et al.
Udgivet: (1989)

Progress in the atomic-scale analysis of materials with the three-dimensional atom probe
af: Cerezo, A, et al.
Udgivet: (2001)

Studies of boundaries and interfaces on the atomic scale by atom probe FIM
af: Smith, G, et al.
Udgivet: (1998)

THE POSITION-SENSITIVE ATOM PROBE - RECONSTRUCTION OF THE ATOMIC CHEMISTRY OF SOLIDS IN 3-DIMENSIONS (SUMMARY)
af: Cerezo, A, et al.
Udgivet: (1991)

STATISTICAL-ANALYSIS OF ATOM PROBE DATA
af: Hetherington, M, et al.
Udgivet: (1986)

Aspects of the observation of clusters in the 3-dimensional atom probe
af: Cerezo, A, et al.
Udgivet: (2007)

STRUCTURAL-ANALYSIS WITH THE POSITION-SENSITIVE ATOM PROBE
af: Hetherington, M, et al.
Udgivet: (1992)

AN ELECTRONIC AND COMPUTER-SYSTEM FOR AN AUTOMATED ATOM PROBE
af: Cerezo, A, et al.
Udgivet: (1984)

IMPROVEMENTS IN THE TRANSMISSION OF VOLTAGE EVAPORATION PULSES IN THE ATOM-PROBE
af: Sijbrandij, S, et al.
Udgivet: (1995)

ATOM PROBE ANALYSIS AND MODELING OF INTERFACES IN MAGNETIC MULTILAYERS
af: Petfordlong, A, et al.
Udgivet: (1992)

Numerical modelling of mass resolution in a scanning atom probe.
af: Cerezo, A, et al.
Udgivet: (2001)

ATOM PROBE CHARACTERIZATION OF CO TRANSITION-METAL MULTILAYER STRUCTURES
af: Cerezo, A, et al.
Udgivet: (1989)

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
af: Grovenor, C, et al.
Udgivet: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
af: Cerezo, A, et al.
Udgivet: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
af: Cerezo, A, et al.
Udgivet: (1986)

Improvements in the mass resolution of the three-dimensional atom probe
af: Sijbrandij, S, et al.
Udgivet: (1996)

Automobile exhaust catalysis at the atomic scale: atom-probe investigations on platinum alloys
af: Bagot, P, et al.
Udgivet: (2007)

ANALYSIS OF DATA FROM AN OPTICAL ATOM-PROBE
af: Cooper, A, et al.
Udgivet: (1994)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
af: Cerezo, A, et al.
Udgivet: (1989)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
af: Cerezo, A, et al.
Udgivet: (1988)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
af: Cerezo, A, et al.
Udgivet: (1988)

Quantum Spin Lenses in Atomic Arrays
af: A. W. Glaetzle, et al.
Udgivet: (2017-09-01)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
af: Cerezo, A, et al.
Udgivet: (1994)

Atom probe tomography today
af: Cerezo, A, et al.
Udgivet: (2007)

Atom probe tomography today
af: Cerezo, A, et al.
Udgivet: (2007)

THE FIM100 - PERFORMANCE OF A COMMERCIAL ATOM PROBE SYSTEM
af: Cerezo, A, et al.
Udgivet: (1984)

A UK Facility for Atom Probe Tomography Analysis
af: Marquis, E, et al.
Udgivet: (2009)

Performance of an energy-compensated three-dimensional atom probe
af: Cerezo, A, et al.
Udgivet: (1998)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
af: Cerezo, A, et al.
Udgivet: (1988)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
af: Grovenor, C, et al.
Udgivet: (1987)

Cluster Lensing of QSOs as a Probe of LCDM and Dark Energy Cosmologies
af: Lopes, A, et al.
Udgivet: (2003)

3D atom probe applications: past present and future
af: G.D.W. Smith, et al.
Udgivet: (2005)

Improvement of multilayer analyses with a three-dimensional atom probe
af: Vurpillot, F, et al.
Udgivet: (2004)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
af: Grovenor, C, et al.
Udgivet: (1983)