EINZEL LENSES IN ATOM PROBE DESIGNS

EINZEL LENSES IN ATOM PROBE DESIGNS

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Cerezo, A, Miller, M
Μορφή:	Conference item
Έκδοση:	1991

Παρόμοια τεκμήρια

A Hyperbolic Potential Field Model for Designing an Einzel Lens of Low Aberrations
ανά: Sabah M. Juma
Έκδοση: (2002-12-01)

Einzel lens chopper and behavior of the chopped beam in the KEK digital accelerator
ανά: K. W. Leo, κ.ά.
Έκδοση: (2013-04-01)

IMPROVEMENTS IN 3-DIMENSIONAL ATOM-PROBE DESIGN
ανά: Cerezo, A, κ.ά.
Έκδοση: (1994)

Design of a scanning atom probe with improved mass resolution
ανά: Cerezo, A, κ.ά.
Έκδοση: (2000)

PULSED LASER ATOM PROBE CHARACTERIZATION OF SILICON-CARBIDE
ανά: Miller, M, κ.ά.
Έκδοση: (1989)

NEW DIMENSIONS IN ATOM-PROBE ANALYSIS
ανά: Cerezo, A, κ.ά.
Έκδοση: (1992)

VISUALIZATION AND ANALYSIS OF 3-DIMENSIONAL ATOM PROBE DATA
ανά: Cerezo, A, κ.ά.
Έκδοση: (1989)

Progress in the atomic-scale analysis of materials with the three-dimensional atom probe
ανά: Cerezo, A, κ.ά.
Έκδοση: (2001)

Studies of boundaries and interfaces on the atomic scale by atom probe FIM
ανά: Smith, G, κ.ά.
Έκδοση: (1998)

THE POSITION-SENSITIVE ATOM PROBE - RECONSTRUCTION OF THE ATOMIC CHEMISTRY OF SOLIDS IN 3-DIMENSIONS (SUMMARY)
ανά: Cerezo, A, κ.ά.
Έκδοση: (1991)

STATISTICAL-ANALYSIS OF ATOM PROBE DATA
ανά: Hetherington, M, κ.ά.
Έκδοση: (1986)

Aspects of the observation of clusters in the 3-dimensional atom probe
ανά: Cerezo, A, κ.ά.
Έκδοση: (2007)

STRUCTURAL-ANALYSIS WITH THE POSITION-SENSITIVE ATOM PROBE
ανά: Hetherington, M, κ.ά.
Έκδοση: (1992)

AN ELECTRONIC AND COMPUTER-SYSTEM FOR AN AUTOMATED ATOM PROBE
ανά: Cerezo, A, κ.ά.
Έκδοση: (1984)

IMPROVEMENTS IN THE TRANSMISSION OF VOLTAGE EVAPORATION PULSES IN THE ATOM-PROBE
ανά: Sijbrandij, S, κ.ά.
Έκδοση: (1995)

ATOM PROBE ANALYSIS AND MODELING OF INTERFACES IN MAGNETIC MULTILAYERS
ανά: Petfordlong, A, κ.ά.
Έκδοση: (1992)

Numerical modelling of mass resolution in a scanning atom probe.
ανά: Cerezo, A, κ.ά.
Έκδοση: (2001)

ATOM PROBE CHARACTERIZATION OF CO TRANSITION-METAL MULTILAYER STRUCTURES
ανά: Cerezo, A, κ.ά.
Έκδοση: (1989)

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
ανά: Grovenor, C, κ.ά.
Έκδοση: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
ανά: Cerezo, A, κ.ά.
Έκδοση: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
ανά: Cerezo, A, κ.ά.
Έκδοση: (1986)

Improvements in the mass resolution of the three-dimensional atom probe
ανά: Sijbrandij, S, κ.ά.
Έκδοση: (1996)

Automobile exhaust catalysis at the atomic scale: atom-probe investigations on platinum alloys
ανά: Bagot, P, κ.ά.
Έκδοση: (2007)

ANALYSIS OF DATA FROM AN OPTICAL ATOM-PROBE
ανά: Cooper, A, κ.ά.
Έκδοση: (1994)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
ανά: Cerezo, A, κ.ά.
Έκδοση: (1989)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
ανά: Cerezo, A, κ.ά.
Έκδοση: (1988)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
ανά: Cerezo, A, κ.ά.
Έκδοση: (1988)

Quantum Spin Lenses in Atomic Arrays
ανά: A. W. Glaetzle, κ.ά.
Έκδοση: (2017-09-01)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
ανά: Cerezo, A, κ.ά.
Έκδοση: (1994)

Atom probe tomography today
ανά: Cerezo, A, κ.ά.
Έκδοση: (2007)

Atom probe tomography today
ανά: Cerezo, A, κ.ά.
Έκδοση: (2007)

THE FIM100 - PERFORMANCE OF A COMMERCIAL ATOM PROBE SYSTEM
ανά: Cerezo, A, κ.ά.
Έκδοση: (1984)

A UK Facility for Atom Probe Tomography Analysis
ανά: Marquis, E, κ.ά.
Έκδοση: (2009)

Performance of an energy-compensated three-dimensional atom probe
ανά: Cerezo, A, κ.ά.
Έκδοση: (1998)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
ανά: Cerezo, A, κ.ά.
Έκδοση: (1988)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
ανά: Grovenor, C, κ.ά.
Έκδοση: (1987)

Cluster Lensing of QSOs as a Probe of LCDM and Dark Energy Cosmologies
ανά: Lopes, A, κ.ά.
Έκδοση: (2003)

3D atom probe applications: past present and future
ανά: G.D.W. Smith, κ.ά.
Έκδοση: (2005)

Improvement of multilayer analyses with a three-dimensional atom probe
ανά: Vurpillot, F, κ.ά.
Έκδοση: (2004)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
ανά: Grovenor, C, κ.ά.
Έκδοση: (1983)