Strain and defect microstructure in ion-irradiated GeSi/Si strained layers as a function of annealing temperature
| Hoofdauteurs: | , , , , |
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| Formaat: | Journal article |
| Gepubliceerd in: |
1998
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| _version_ | 1826294600597241856 |
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| author | Glasko, J Elliman, R Zou, J Cockayne, D Gerald, F |
| author_facet | Glasko, J Elliman, R Zou, J Cockayne, D Gerald, F |
| author_sort | Glasko, J |
| collection | OXFORD |
| description | |
| first_indexed | 2024-03-07T03:48:10Z |
| format | Journal article |
| id | oxford-uuid:c03d8018-6f9d-404f-8a2c-e46a61e2da7b |
| institution | University of Oxford |
| last_indexed | 2024-03-07T03:48:10Z |
| publishDate | 1998 |
| record_format | dspace |
| spelling | oxford-uuid:c03d8018-6f9d-404f-8a2c-e46a61e2da7b2022-03-27T05:53:14ZStrain and defect microstructure in ion-irradiated GeSi/Si strained layers as a function of annealing temperatureJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:c03d8018-6f9d-404f-8a2c-e46a61e2da7bSymplectic Elements at Oxford1998Glasko, JElliman, RZou, JCockayne, DGerald, F |
| spellingShingle | Glasko, J Elliman, R Zou, J Cockayne, D Gerald, F Strain and defect microstructure in ion-irradiated GeSi/Si strained layers as a function of annealing temperature |
| title | Strain and defect microstructure in ion-irradiated GeSi/Si strained layers as a function of annealing temperature |
| title_full | Strain and defect microstructure in ion-irradiated GeSi/Si strained layers as a function of annealing temperature |
| title_fullStr | Strain and defect microstructure in ion-irradiated GeSi/Si strained layers as a function of annealing temperature |
| title_full_unstemmed | Strain and defect microstructure in ion-irradiated GeSi/Si strained layers as a function of annealing temperature |
| title_short | Strain and defect microstructure in ion-irradiated GeSi/Si strained layers as a function of annealing temperature |
| title_sort | strain and defect microstructure in ion irradiated gesi si strained layers as a function of annealing temperature |
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