Investigating the diameter-dependent stability of single-walled carbon nanotubes
We investigate the long-standing question of whether electrons accelerated at 80 kV are below the knock-on damage threshold for single-walled carbon nanotubes (SWNTs). Aberration-corrected high-resolution transmission electron microscopy is used to directly image the atomic structure of the SWNTs an...
| 主要な著者: | , , , , , , |
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| フォーマット: | Journal article |
| 言語: | English |
| 出版事項: |
2009
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