Quantification of grain boundary equilibrium segregation by NanoSIMS analysis of bulk samples
A technique for the quantification of equilibrium grain boundary segregation by high resolution secondary ion mass spectroscopy (NanoSIMS) on simple metallographically polished surfaces has been demonstrated for the model system of sulphur segregation to nickel grain boundaries. Samples of nickel co...
| Հիմնական հեղինակներ: | , , , |
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| Ձևաչափ: | Journal article |
| Լեզու: | English |
| Հրապարակվել է: |
2012
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