Characterisation of porous silicon field emitter properties

The field emission properties and structure of silicon field emitter tips, covered with a porous silicon layer have been studied. The emission from porous silicon emitters with a variety of morphologies, thicknesses and substrate types have been investigated using both an adapted scanning electron m...

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Hlavní autoři: Boswell, E, Huang, M, Smith, G, Wilshaw, P
Médium: Conference item
Vydáno: IEEE 1995