Characterisation of porous silicon field emitter properties

The field emission properties and structure of silicon field emitter tips, covered with a porous silicon layer have been studied. The emission from porous silicon emitters with a variety of morphologies, thicknesses and substrate types have been investigated using both an adapted scanning electron m...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид: Boswell, E, Huang, M, Smith, G, Wilshaw, P
Формат: Conference item
Хэвлэсэн: IEEE 1995