Transmission electron microscopy study of the Fe(001)vertical bar MgO(001) interface for magnetic tunnel junctions
Transmission electron microscopy (TEM) is employed to characterize ex situ the interface between the bottom Fe (001) electrode and MgO (001) barrier in a magnetic tunnel junction (MTJ) deposited by molecular beam epitaxy. High resolution TEM images are compared with multislice-based simulations of o...
| Príomhchruthaitheoirí: | , , , , |
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| Formáid: | Conference item |
| Foilsithe / Cruthaithe: |
2007
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| Achoimre: | Transmission electron microscopy (TEM) is employed to characterize ex situ the interface between the bottom Fe (001) electrode and MgO (001) barrier in a magnetic tunnel junction (MTJ) deposited by molecular beam epitaxy. High resolution TEM images are compared with multislice-based simulations of oxidized and sharp interfaces to conclude that at least the part of the interface is not oxidized. In addition, the, spacing between the Fe and O layers at the interface is measured and found to be comparable with theoretical calculations in the literature of sharp interfaces. This result offers a methodology to characterize the interface structure of MTJs, which is important to determine the magneto-transport properties of the device. |
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