Transmission electron microscopy study of the Fe(001)vertical bar MgO(001) interface for magnetic tunnel junctions

Transmission electron microscopy study of the Fe(001)vertical bar MgO(001) interface for magnetic tunnel junctions

Transmission electron microscopy (TEM) is employed to characterize ex situ the interface between the bottom Fe (001) electrode and MgO (001) barrier in a magnetic tunnel junction (MTJ) deposited by molecular beam epitaxy. High resolution TEM images are compared with multislice-based simulations of o...

Полное описание

Библиографические подробности
Главные авторы:	Wang, C, Wang, S, Kohn, A, Ward, R, Petford-Long, A
Формат:	Conference item
Опубликовано:	2007

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