Coma aberrations in combined two- and three-dimensional STED nanoscopy
Stimulated emission depletion (STED) microscopes, like all super-resolution methods, are sensitive to aberrations. Of particular importance are aberrations that affect the quality of the depletion focus, which requires a point of near-zero intensity surrounded by strong illumination. We present anal...
| প্রধান লেখক: | , , , , |
|---|---|
| বিন্যাস: | Journal article |
| প্রকাশিত: |
Optical Society of America
2016
|