Coma aberrations in combined two- and three-dimensional STED nanoscopy
Stimulated emission depletion (STED) microscopes, like all super-resolution methods, are sensitive to aberrations. Of particular importance are aberrations that affect the quality of the depletion focus, which requires a point of near-zero intensity surrounded by strong illumination. We present anal...
| Autores principales: | , , , , |
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| Formato: | Journal article |
| Publicado: |
Optical Society of America
2016
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