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Strain relaxation by alloying...
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Strain relaxation by alloying effects in Ge islands grown on Si(001)
Manylion Llyfryddiaeth
Prif Awduron:
Liao, X
,
Zou, J
,
Cockayne, D
,
Qin, J
,
Jiang, Z
,
Wang, X
,
Leon, R
Fformat:
Journal article
Cyhoeddwyd:
1999
Daliadau
Disgrifiad
Eitemau Tebyg
Dangos Staff
Disgrifiad
Crynodeb:
Eitemau Tebyg
Extracting composition and alloying information of coherent Ge(Si)/Si(001) islands from [001] on-zone bright-field diffraction contrast images
gan: Liao, X, et al.
Cyhoeddwyd: (2001)
Alloying and Strain Relaxation in SiGe Islands Grown on Pit-Patterned Si(001) Substrates Probed by Nanotomography
gan: Merdzhanova T, et al.
Cyhoeddwyd: (2009-01-01)
[001] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(001).
gan: Liao, X, et al.
Cyhoeddwyd: (2004)
Alternative mechanism for misfit dislocation generation during high-temperature Ge(Si)/Si(001) island growth
gan: Zou, J, et al.
Cyhoeddwyd: (2002)
Alloying, elemental enrichment, and interdiffusion during the growth of Ge(Si)/Si(001) quantum dots
gan: Liao, X, et al.
Cyhoeddwyd: (2002)