Nitrogen diffusion in doped TiO2 (110) single crystals: a combined XPS and SIMS study

Nitrogen diffusion in doped TiO2 (110) single crystals: a combined XPS and SIMS study

Rutile TiO2 (110) single crystals were doped with nitrogen by heating at 675 °C in flowing NH3 gas. This caused a red shift in the band edge and an increase in visible region absorption. Nitrogen depth profiles obtained using dynamic secondary ion mass spectrometry (SIMS) could best be fitted by ass...

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Bibliographic Details
Main Authors:	Palgrave, R, Payne, D, Egdell, R
Format:	Journal article
Language:	English
Published:	2009

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