Curvatures and inhomogeneities: An improved common-reflection-surface approach
Multiparameter stacking is an important tool to obtain a first reliable time image of the subsurface. In addition, it provides wavefield attributes, which form the basis for many important applications. The quality of the image and the attribute estimates relies heavily on the accuracy of the travel...
| Päätekijät: | , , , |
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| Aineistotyyppi: | Journal article |
| Kieli: | English |
| Julkaistu: |
Society of Exploration Geophysicists
2014
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