Microscope imaging mass spectrometry with a reflectron
A time-of-flight microscope imaging mass spectrometer incorporating a reflectron was used to image mass-resolved ions generated from a 270 μm diameter surface. Mass and spatial resolutions of 8100 ± 700 m/Δm and 18 μm ± 6 μm, respectively, were obtained simultaneously by using pulsed extraction diff...
| Main Authors: | , , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
AIP Publishing
2020
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| _version_ | 1797095051378032640 |
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| author | Burleigh, RJ Guo, A Smith, N Green, A Thompson, S Burt, M Brouard, M |
| author_facet | Burleigh, RJ Guo, A Smith, N Green, A Thompson, S Burt, M Brouard, M |
| author_sort | Burleigh, RJ |
| collection | OXFORD |
| description | A time-of-flight microscope imaging mass spectrometer incorporating a reflectron was used to image mass-resolved ions generated from a 270 μm diameter surface. Mass and spatial resolutions of 8100 ± 700 m/Δm and 18 μm ± 6 μm, respectively, were obtained simultaneously by using pulsed extraction differential acceleration ion optical focusing to create a pseudo-source plane for a single-stage gridless reflectron. The obtainable mass resolution was limited only by the response time of the position-sensitive detector and, according to simulations, could potentially reach 30 200 ± 2900 m/Δm. The spatial resolution can be further improved at the expense of the mass resolution to at least 6 μm by increasing the applied extraction field. An event-triggered fast imaging sensor was additionally used to record ion images for each time-of-flight peak resolved during an experimental cycle, demonstrating the high-throughput capability of the instrument. |
| first_indexed | 2024-03-07T04:22:30Z |
| format | Journal article |
| id | oxford-uuid:cb7ea049-e4eb-433c-9aa9-df2fbc365e83 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T04:22:30Z |
| publishDate | 2020 |
| publisher | AIP Publishing |
| record_format | dspace |
| spelling | oxford-uuid:cb7ea049-e4eb-433c-9aa9-df2fbc365e832022-03-27T07:15:18ZMicroscope imaging mass spectrometry with a reflectronJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:cb7ea049-e4eb-433c-9aa9-df2fbc365e83EnglishSymplectic ElementsAIP Publishing2020Burleigh, RJGuo, ASmith, NGreen, AThompson, SBurt, MBrouard, MA time-of-flight microscope imaging mass spectrometer incorporating a reflectron was used to image mass-resolved ions generated from a 270 μm diameter surface. Mass and spatial resolutions of 8100 ± 700 m/Δm and 18 μm ± 6 μm, respectively, were obtained simultaneously by using pulsed extraction differential acceleration ion optical focusing to create a pseudo-source plane for a single-stage gridless reflectron. The obtainable mass resolution was limited only by the response time of the position-sensitive detector and, according to simulations, could potentially reach 30 200 ± 2900 m/Δm. The spatial resolution can be further improved at the expense of the mass resolution to at least 6 μm by increasing the applied extraction field. An event-triggered fast imaging sensor was additionally used to record ion images for each time-of-flight peak resolved during an experimental cycle, demonstrating the high-throughput capability of the instrument. |
| spellingShingle | Burleigh, RJ Guo, A Smith, N Green, A Thompson, S Burt, M Brouard, M Microscope imaging mass spectrometry with a reflectron |
| title | Microscope imaging mass spectrometry with a reflectron |
| title_full | Microscope imaging mass spectrometry with a reflectron |
| title_fullStr | Microscope imaging mass spectrometry with a reflectron |
| title_full_unstemmed | Microscope imaging mass spectrometry with a reflectron |
| title_short | Microscope imaging mass spectrometry with a reflectron |
| title_sort | microscope imaging mass spectrometry with a reflectron |
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