Terahertz probe of carrier trapping in polymer transistors
The trapped charge density at the polymer-insulator boundary of polymer transistors was monitored by terahertz time-domain spectroscopy. Additionally, the thermal removal of trapped holes and the light-induced transmission change were studied. © 2006 Optical Society of America.
| Main Authors: | , , , , , |
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| פורמט: | Journal article |
| שפה: | English |
| יצא לאור: |
Optical Society of America
2007
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