Band offsets at the Si/SiO2 interface from many-body perturbation theory.
We use many-body perturbation theory, the state-of-the-art method for band-gap calculations, to compute the band offsets at the Si/SiO2 interface. We examine the adequacy of the usual approximations in this context. We show that (i) the separate treatment of band structure and potential lineup contr...
Huvudupphovsmän: | Shaltaf, R, Rignanese, G, Gonze, X, Giustino, F, Pasquarello, A |
---|---|
Materialtyp: | Journal article |
Språk: | English |
Publicerad: |
2008
|
Liknande verk
-
Band offsets at the Si/SiO2 interface from many-body perturbation theory
av: Shaltaf, R, et al.
Publicerad: (2008) -
Atomic-scale modelling of the Si(100)-SiO(2) interface
av: Giustino, F, et al.
Publicerad: (2005) -
Electronic structure at realistic Si(100)-SiO2 interfaces
av: Giustino, F, et al.
Publicerad: (2004) -
Abrupt model interface for the 4H(1000)SiC-SiO2 interface
av: Devynck, F, et al.
Publicerad: (2005) -
Infrared spectra at surfaces and interfaces from first principles: evolution of the spectra across the Si(100)-SiO2 interface.
av: Giustino, F, et al.
Publicerad: (2005)