Growth of microscale In2O3 islands on Y-stabilized zirconia(100) by molecular beam epitaxy

The growth of micrometer sized arrays of InO islands on Y-stabilized ZrO(100) was investigated. Indium oxide layers were grown on Y-stabilized ZrO(100) substrates in a UHV oxide MBE system with a base pressure of 5 × 10 mbar and incorporating an indium Knudsen cell and a radiofrequency oxygen plasma...

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Bibliografski detalji
Glavni autori: Bourlange, A, Payne, D, Jacobs, R, Egdell, R, Foord, J, Schertel, A, Dobson, P, Hutchison, J
Format: Journal article
Izdano: 2008
Opis
Sažetak:The growth of micrometer sized arrays of InO islands on Y-stabilized ZrO(100) was investigated. Indium oxide layers were grown on Y-stabilized ZrO(100) substrates in a UHV oxide MBE system with a base pressure of 5 × 10 mbar and incorporating an indium Knudsen cell and a radiofrequency oxygen plasma source. Substrates were cleaned by exposure to the oxygen atom beam at a substrate temperature of 900 °C. Films were then grown to an estimated thickness of 120 nm with a deposition rate of 0.04 nm/s at a substrate temperature of 900 °C. The epitaxial relationship between the InO islands and the substrate is confirmed by selected area electron diffraction carried out in the HRTEM. It was observed that Y-stabilized ZrO is a versatile substrate whose lattice parameter varies with Y doping level, thus providing a means of varying the mismatch with InO epilayers.