Wilshaw, P., Wilshaw, P., & Ourmazd, A. (1984). An SEM EBIC study of the electronic properties of dislocations in silicon.
Chicago Style (17th ed.) CitationWilshaw, P., Peter Wilshaw, and A. Ourmazd. An SEM EBIC Study of the Electronic Properties of Dislocations in Silicon. 1984.
ציטוט MLAWilshaw, P., et al. An SEM EBIC Study of the Electronic Properties of Dislocations in Silicon. 1984.
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