Wilshaw, P., Wilshaw, P., & Ourmazd, A. (1984). An SEM EBIC study of the electronic properties of dislocations in silicon.
Chicagoスタイル(17版)引用形式Wilshaw, P., Peter Wilshaw, , A. Ourmazd. An SEM EBIC Study of the Electronic Properties of Dislocations in Silicon. 1984.
MLA(9版)引用形式Wilshaw, P., et al. An SEM EBIC Study of the Electronic Properties of Dislocations in Silicon. 1984.
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