Wilshaw, P., Wilshaw, P., & Ourmazd, A. (1984). An SEM EBIC study of the electronic properties of dislocations in silicon.
Chicago Style (17th ed.) CitationWilshaw, P., Peter Wilshaw, and A. Ourmazd. An SEM EBIC Study of the Electronic Properties of Dislocations in Silicon. 1984.
MLA引文Wilshaw, P., et al. An SEM EBIC Study of the Electronic Properties of Dislocations in Silicon. 1984.
警告:這些引文格式不一定是100%准確.