An SEM EBIC study of the electronic properties of dislocations in silicon

An SEM EBIC study of the electronic properties of dislocations in silicon

<p>Individual, well structurally characterised dislocations present in n-type silicon have been studied using the electron beam induced current (EBIC) mode of an SEM.</p>An EBIC system has been designed and constructed which includes i) phase sensitive detection, ii) computerised contro...

Cur síos iomlán

Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:	Wilshaw, P, Wilshaw, Peter
Rannpháirtithe:	Ourmazd, A
Formáid:	Tráchtas
Teanga:	English
Foilsithe / Cruthaithe:	1984
Ábhair:	Dislocations in metals Defects Silicon Scanning electron microscopy

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