Wen, Y., Ophus, C., Allen, C., Fang, S., Chen, J., Kaxiras, E., . . . Warner, J. (2019). Simultaneous identification of low and high atomic number atoms in monolayer 2D materials using 4D scanning transmission electron microscopy. American Chemical Society.
توثيق أسلوب شيكاغو (الطبعة السابعة عشر)Wen, Y., C. Ophus, CS Allen, S. Fang, J. Chen, E. Kaxiras, AI Kirkland, و JH Warner. Simultaneous Identification of Low and High Atomic Number Atoms in Monolayer 2D Materials Using 4D Scanning Transmission Electron Microscopy. American Chemical Society, 2019.
توثيق جمعية اللغة المعاصرة MLA (الإصدار التاسع)Wen, Y., et al. Simultaneous Identification of Low and High Atomic Number Atoms in Monolayer 2D Materials Using 4D Scanning Transmission Electron Microscopy. American Chemical Society, 2019.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.