APA(7版)引用形式

Wen, Y., Ophus, C., Allen, C., Fang, S., Chen, J., Kaxiras, E., . . . Warner, J. (2019). Simultaneous identification of low and high atomic number atoms in monolayer 2D materials using 4D scanning transmission electron microscopy. American Chemical Society.

Chicagoスタイル(17版)引用形式

Wen, Y., C. Ophus, CS Allen, S. Fang, J. Chen, E. Kaxiras, AI Kirkland, , JH Warner. Simultaneous Identification of Low and High Atomic Number Atoms in Monolayer 2D Materials Using 4D Scanning Transmission Electron Microscopy. American Chemical Society, 2019.

MLA(9版)引用形式

Wen, Y., et al. Simultaneous Identification of Low and High Atomic Number Atoms in Monolayer 2D Materials Using 4D Scanning Transmission Electron Microscopy. American Chemical Society, 2019.