Wen, Y., Ophus, C., Allen, C., Fang, S., Chen, J., Kaxiras, E., . . . Warner, J. (2019). Simultaneous identification of low and high atomic number atoms in monolayer 2D materials using 4D scanning transmission electron microscopy. American Chemical Society.
Citação norma ChicagoWen, Y., C. Ophus, CS Allen, S. Fang, J. Chen, E. Kaxiras, AI Kirkland, and JH Warner. Simultaneous Identification of Low and High Atomic Number Atoms in Monolayer 2D Materials Using 4D Scanning Transmission Electron Microscopy. American Chemical Society, 2019.
Citação norma MLAWen, Y., et al. Simultaneous Identification of Low and High Atomic Number Atoms in Monolayer 2D Materials Using 4D Scanning Transmission Electron Microscopy. American Chemical Society, 2019.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.