Стиль цитування APA (7-ме видання)

Wen, Y., Ophus, C., Allen, C., Fang, S., Chen, J., Kaxiras, E., . . . Warner, J. (2019). Simultaneous identification of low and high atomic number atoms in monolayer 2D materials using 4D scanning transmission electron microscopy. American Chemical Society.

Чикаго стиль цитування (17-те видання)

Wen, Y., C. Ophus, CS Allen, S. Fang, J. Chen, E. Kaxiras, AI Kirkland, та JH Warner. Simultaneous Identification of Low and High Atomic Number Atoms in Monolayer 2D Materials Using 4D Scanning Transmission Electron Microscopy. American Chemical Society, 2019.

Стиль цитування MLA (9-ме видання)

Wen, Y., et al. Simultaneous Identification of Low and High Atomic Number Atoms in Monolayer 2D Materials Using 4D Scanning Transmission Electron Microscopy. American Chemical Society, 2019.