APA引文

Wen, Y., Ophus, C., Allen, C., Fang, S., Chen, J., Kaxiras, E., . . . Warner, J. (2019). Simultaneous identification of low and high atomic number atoms in monolayer 2D materials using 4D scanning transmission electron microscopy. American Chemical Society.

Chicago Style (17th ed.) Citation

Wen, Y., C. Ophus, CS Allen, S. Fang, J. Chen, E. Kaxiras, AI Kirkland, and JH Warner. Simultaneous Identification of Low and High Atomic Number Atoms in Monolayer 2D Materials Using 4D Scanning Transmission Electron Microscopy. American Chemical Society, 2019.

MLA引文

Wen, Y., et al. Simultaneous Identification of Low and High Atomic Number Atoms in Monolayer 2D Materials Using 4D Scanning Transmission Electron Microscopy. American Chemical Society, 2019.