Simultaneous identification of low and high atomic number atoms in monolayer 2D materials using 4D scanning transmission electron microscopy

Simultaneous identification of low and high atomic number atoms in monolayer 2D materials using 4D scanning transmission electron microscopy

Simultaneous imaging of individual low and high atomic number atoms using annular dark field scanning transmission electron microscopy (ADF-STEM) is often challenging due to substantial differences in their scattering cross sections. This often leads to contrast from only the high atomic number spec...

書誌詳細
主要な著者:	Wen, Y, Ophus, C, Allen, CS, Fang, S, Chen, J, Kaxiras, E, Kirkland, AI, Warner, JH
フォーマット:	Journal article
言語:	English
出版事項:	American Chemical Society 2019

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