IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE
Main Authors: | , , , |
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Format: | Journal article |
Published: |
1990
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_version_ | 1826297506498084864 |
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author | Czernuszka, J Long, N Boyes, E Hirsch, P |
author_facet | Czernuszka, J Long, N Boyes, E Hirsch, P |
author_sort | Czernuszka, J |
collection | OXFORD |
description | |
first_indexed | 2024-03-07T04:32:40Z |
format | Journal article |
id | oxford-uuid:cedca986-5eec-4e4b-8b0b-cb034ed1f957 |
institution | University of Oxford |
last_indexed | 2024-03-07T04:32:40Z |
publishDate | 1990 |
record_format | dspace |
spelling | oxford-uuid:cedca986-5eec-4e4b-8b0b-cb034ed1f9572022-03-27T07:38:28ZIMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPEJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:cedca986-5eec-4e4b-8b0b-cb034ed1f957Symplectic Elements at Oxford1990Czernuszka, JLong, NBoyes, EHirsch, P |
spellingShingle | Czernuszka, J Long, N Boyes, E Hirsch, P IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE |
title | IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE |
title_full | IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE |
title_fullStr | IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE |
title_full_unstemmed | IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE |
title_short | IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE |
title_sort | imaging of dislocations using backscattered electrons in a scanning electron microscope |
work_keys_str_mv | AT czernuszkaj imagingofdislocationsusingbackscatteredelectronsinascanningelectronmicroscope AT longn imagingofdislocationsusingbackscatteredelectronsinascanningelectronmicroscope AT boyese imagingofdislocationsusingbackscatteredelectronsinascanningelectronmicroscope AT hirschp imagingofdislocationsusingbackscatteredelectronsinascanningelectronmicroscope |