3D atom probe analysis of quantum well and quantum dot materials
Main Authors: | Cerezo, A, Chang, L, Clifton, P, Galtrey, M, Gerstl, S, Humphreys, C, Müller, M, Oliver, R, Smith, G, Wu, Y |
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מחברים אחרים: | Microscopy Society of America |
פורמט: | Journal article |
שפה: | English |
יצא לאור: |
Cambridge University Press
2007
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נושאים: |
פריטים דומים
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Atom probe revels the structure of InxGe1-xN based quantum wells in three dimensions
מאת: Galtrey, M, et al.
יצא לאור: (2008) -
Three-dimensional atom probe studies of an InxGa1-xN/GaN multiple quantum well structure: Assessment of possible indium clustering
מאת: Galtrey, M, et al.
יצא לאור: (2007) -
Atomic scale characterization of buried In(x)Ga(1-x)As quantum dots using pulsed laser atom probe tomography
מאת: Mueller, M, et al.
יצא לאור: (2008) -
Three-dimensional atom probe analysis of green- and blue-emitting In(x)Ga(1-x)N/GaN multiple quantum well structures
מאת: Galtrey, M, et al.
יצא לאור: (2008) -
Response to "Comment on 'Three-dimensional atom probe studies of an InxGa1-N-x/GaN multiple quantum well structure: assessment of possible indium clustering'" [Appl. Phys. Lett. 91, 176101, (2007)]
מאת: Galtrey, M, et al.
יצא לאור: (2007)