3D atom probe analysis of quantum well and quantum dot materials
Autori principali: | Cerezo, A, Chang, L, Clifton, P, Galtrey, M, Gerstl, S, Humphreys, C, Müller, M, Oliver, R, Smith, G, Wu, Y |
---|---|
Altri autori: | Microscopy Society of America |
Natura: | Journal article |
Lingua: | English |
Pubblicazione: |
Cambridge University Press
2007
|
Soggetti: |
Documenti analoghi
Documenti analoghi
-
Atom probe revels the structure of InxGe1-xN based quantum wells in three dimensions
di: Galtrey, M, et al.
Pubblicazione: (2008) -
Three-dimensional atom probe studies of an InxGa1-xN/GaN multiple quantum well structure: Assessment of possible indium clustering
di: Galtrey, M, et al.
Pubblicazione: (2007) -
Atomic scale characterization of buried In(x)Ga(1-x)As quantum dots using pulsed laser atom probe tomography
di: Mueller, M, et al.
Pubblicazione: (2008) -
Three-dimensional atom probe analysis of green- and blue-emitting In(x)Ga(1-x)N/GaN multiple quantum well structures
di: Galtrey, M, et al.
Pubblicazione: (2008) -
Response to "Comment on 'Three-dimensional atom probe studies of an InxGa1-N-x/GaN multiple quantum well structure: assessment of possible indium clustering'" [Appl. Phys. Lett. 91, 176101, (2007)]
di: Galtrey, M, et al.
Pubblicazione: (2007)