Cita APA

Tweddle, D., & Moody, M. (2019). Atom probe tomography of crystallographic defects in silicon.

Citación estilo Chicago

Tweddle, D., and M. Moody. Atom Probe Tomography of Crystallographic Defects in Silicon. 2019.

Cita MLA

Tweddle, D., and M. Moody. Atom Probe Tomography of Crystallographic Defects in Silicon. 2019.

Warning: These citations may not always be 100% accurate.