Tweddle, D., & Moody, M. (2019). Atom probe tomography of crystallographic defects in silicon.
Lua i Stíl Chicago (17ú heag.)Tweddle, D., agus M. Moody. Atom Probe Tomography of Crystallographic Defects in Silicon. 2019.
Lua MLA (9ú heag.)Tweddle, D., agus M. Moody. Atom Probe Tomography of Crystallographic Defects in Silicon. 2019.
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