APA ציטוט

Tweddle, D., & Moody, M. (2019). Atom probe tomography of crystallographic defects in silicon.

Chicago Style (17th ed.) Citation

Tweddle, D., and M. Moody. Atom Probe Tomography of Crystallographic Defects in Silicon. 2019.

ציטוט MLA

Tweddle, D., and M. Moody. Atom Probe Tomography of Crystallographic Defects in Silicon. 2019.