APA引文

Tweddle, D., & Moody, M. (2019). Atom probe tomography of crystallographic defects in silicon.

Chicago Style (17th ed.) Citation

Tweddle, D., and M. Moody. Atom Probe Tomography of Crystallographic Defects in Silicon. 2019.

MLA引文

Tweddle, D., and M. Moody. Atom Probe Tomography of Crystallographic Defects in Silicon. 2019.

警告：這些引文格式不一定是100％准確.