Tweddle, D., & Moody, M. (2019). Atom probe tomography of crystallographic defects in silicon.
芝加哥风格引文Tweddle, D., 与 M. Moody. Atom Probe Tomography of Crystallographic Defects in Silicon. 2019.
MLA引文Tweddle, D., 与 M. Moody. Atom Probe Tomography of Crystallographic Defects in Silicon. 2019.
警告：这些引文格式不一定是100％准确.