Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting.
Quantitative annular dark field scanning transmission electron microscopy (ADF STEM) has become a powerful technique to characterise nano-particles on an atomic scale. Because of their limited size and beam sensitivity, the atomic structure of such particles may become extremely challenging to deter...
| Κύριοι συγγραφείς: | , , , , , , |
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| Μορφή: | Journal article |
| Γλώσσα: | English |
| Έκδοση: |
Elsevier
2015
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