Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting.

समान संसाधन

• Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy.
  द्वारा: van den Bos, K, और अन्य
  प्रकाशित: (2016)
• Control of knock-on damage for 3D atomic scale quantification of nanostructures: Making every electron count in scanning transmission electron microscopy
  द्वारा: Van Aert, S, और अन्य
  प्रकाशित: (2019)
• Element specific atom counting at the atomic scale by combining high angle annular dark field scanning transmission electron microscopy and energy dispersive X-ray spectroscopy
  द्वारा: De Backer, A, और अन्य
  प्रकाशित: (2022)
• Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy
  द्वारा: Martinez, G, और अन्य
  प्रकाशित: (2018)
• Towards quantitative analysis of core-shell catalyst nano-particles by aberration corrected high angle annular dark field STEM and EDX
  द्वारा: E, H, और अन्य
  प्रकाशित: (2010)