Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting.

Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting.

Quantitative annular dark field scanning transmission electron microscopy (ADF STEM) has become a powerful technique to characterise nano-particles on an atomic scale. Because of their limited size and beam sensitivity, the atomic structure of such particles may become extremely challenging to deter...

Descripción completa

Detalles Bibliográficos
Autores principales: De Backer, A, Martinez, G, MacArthur, K, Jones, L, Béché, A, Nellist, P, Van Aert, S
Formato: Journal article
Lenguaje:English
Publicado: Elsevier 2015

Ejemplares similares

Ejemplares similares