EBIC CONTRAST OF DEFECTS IN SEMICONDUCTORS

Bibliographic Details
Main Authors: Wilshaw, P, Fell, T, Coteau, M
Format: Conference item
Published: 1991
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author Wilshaw, P
Fell, T
Coteau, M
author_facet Wilshaw, P
Fell, T
Coteau, M
author_sort Wilshaw, P
collection OXFORD
description
first_indexed 2024-03-07T04:48:54Z
format Conference item
id oxford-uuid:d44650aa-95e1-489d-9a7e-51016513ec85
institution University of Oxford
last_indexed 2024-03-07T04:48:54Z
publishDate 1991
record_format dspace
spelling oxford-uuid:d44650aa-95e1-489d-9a7e-51016513ec852022-03-27T08:17:18ZEBIC CONTRAST OF DEFECTS IN SEMICONDUCTORSConference itemhttp://purl.org/coar/resource_type/c_5794uuid:d44650aa-95e1-489d-9a7e-51016513ec85Symplectic Elements at Oxford1991Wilshaw, PFell, TCoteau, M
spellingShingle Wilshaw, P
Fell, T
Coteau, M
EBIC CONTRAST OF DEFECTS IN SEMICONDUCTORS
title EBIC CONTRAST OF DEFECTS IN SEMICONDUCTORS
title_full EBIC CONTRAST OF DEFECTS IN SEMICONDUCTORS
title_fullStr EBIC CONTRAST OF DEFECTS IN SEMICONDUCTORS
title_full_unstemmed EBIC CONTRAST OF DEFECTS IN SEMICONDUCTORS
title_short EBIC CONTRAST OF DEFECTS IN SEMICONDUCTORS
title_sort ebic contrast of defects in semiconductors
work_keys_str_mv AT wilshawp ebiccontrastofdefectsinsemiconductors
AT fellt ebiccontrastofdefectsinsemiconductors
AT coteaum ebiccontrastofdefectsinsemiconductors