Low-voltage SEM of air-sensitive powders: From sample preparation to micro/nano analysis with secondary electron hyperspectral imaging

Powder materials are used in all corners of materials science, from additive manufacturing to energy storage. Scanning electron microscopy (SEM) has developed to meet morphological, microstructural and bulk chemical powder characterization requirements. These include nanoscale elemental analysis and...

Полное описание

Библиографические подробности
Главные авторы: Nohl, JF, Farr, NTH, Sun, Y, Hughes, GM, Cussen, SA, Rodenburg, C
Формат: Journal article
Язык:English
Опубликовано: Elsevier 2022